TESTING AND DEBUGGING CUSTOM INTEGRATED-CIRCUITS

被引：0

作者：

FRANK, EH

SPROULL, RF

机构：

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D O I：

暂无

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

引用

页码：425 / 451

页数：27

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[1] CUSTOM INTEGRATED-CIRCUITS
REHMAN, MA
ELECTRONIC ENGINEERING, 1980, 52 (636): : 55 - &
[2] RATIONALE FOR CUSTOM INTEGRATED-CIRCUITS
SCHARE, D
ELECTRONIC ENGINEERING, 1979, 51 (631): : 155 - &
[3] CUSTOM DESIGN IN MOS INTEGRATED-CIRCUITS
HILL, J
GEC-JOURNAL OF SCIENCE & TECHNOLOGY, 1974, 41 (01): : 15 - 20
[4] FORUM ON CUSTOM AND SEMICUSTOM INTEGRATED-CIRCUITS
YATES, W
ELECTRONIC PRODUCTS MAGAZINE, 1979, 22 (01): : 33 - 40
[5] CUSTOM DESIGN IN MOS INTEGRATED-CIRCUITS
HILL, J
JOURNAL OF SCIENCE AND TECHNOLOGY, 1974, 41 (01): : 15 - 20
[6] THE 1987 CUSTOM INTEGRATED-CIRCUITS CONFERENCE
BERESFORD, R
VLSI SYSTEMS DESIGN, 1987, 8 (04): : 36 - 38
[7] THE 1988 CUSTOM INTEGRATED-CIRCUITS CONFERENCE
WITTENBERG, RC
VLSI SYSTEMS DESIGN, 1988, 9 (04): : 19 - 21
[8] REPORT ON 1988 CUSTOM INTEGRATED-CIRCUITS CONFERENCE
不详
IEEE CIRCUITS AND DEVICES MAGAZINE, 1988, 4 (06): : 29 - 29
[9] THE 1994 CUSTOM INTEGRATED-CIRCUITS CONFERENCE - INTRODUCTION
WESTE, NHE
GOPINATHAN, V
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1995, 30 (03) : 163 - 165
[10] CUSTOM DESIGN OF MONOLITHIC MICROWAVE INTEGRATED-CIRCUITS
MOORE, CR
PENN, JE
JOHNS HOPKINS APL TECHNICAL DIGEST, 1993, 14 (04): : 300 - 306