STRUCTURE OF EVAPORATED PURE AMORPHOUS-SILICON - NEUTRON-DIFFRACTION AND REVERSE MONTE-CARLO INVESTIGATIONS

被引：84

作者：

KUGLER, S

PUSZTAI, L

ROSTA, L

CHIEUX, P

BELLISSENT, R

机构：

[1] EOTVOS LORAND UNIV, THEORET CHEM LAB, H-1518 BUDAPEST 112, HUNGARY

[2] HUNGARIAN ACAD SCI, CENT RES INST PHYS, H-1525 BUDAPEST, HUNGARY

[3] INST MAX VON LAUE PAUL LANGEVIN, F-38042 GRENOBLE, FRANCE

[4] CENS, LAB LEON BRILLOUIN, F-91191 GIF SUR YVETTE, FRANCE

来源：

PHYSICAL REVIEW B | 1993年 / 48卷 / 10期

关键词：

D O I：

10.1103/PhysRevB.48.7685

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A neutron-diffraction measurement in the 0-23 angstrom-1 inverse space interval was performed on pure amorphous Si. With the structure factor obtained experimentally three-dimensional models were constructed by reverse Monte Carlo simulation for the determination of the atomic structure of a-Si. The radial distribution function was calculated directly from the large-scale models and was derived traditionally from these wide range spectra, as well.

引用

页码：7685 / 7688

页数：4

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