STRUCTURE OF EVAPORATED PURE AMORPHOUS-SILICON - NEUTRON-DIFFRACTION AND REVERSE MONTE-CARLO INVESTIGATIONS

被引:84
作者
KUGLER, S
PUSZTAI, L
ROSTA, L
CHIEUX, P
BELLISSENT, R
机构
[1] EOTVOS LORAND UNIV, THEORET CHEM LAB, H-1518 BUDAPEST 112, HUNGARY
[2] HUNGARIAN ACAD SCI, CENT RES INST PHYS, H-1525 BUDAPEST, HUNGARY
[3] INST MAX VON LAUE PAUL LANGEVIN, F-38042 GRENOBLE, FRANCE
[4] CENS, LAB LEON BRILLOUIN, F-91191 GIF SUR YVETTE, FRANCE
来源
PHYSICAL REVIEW B | 1993年 / 48卷 / 10期
关键词
D O I
10.1103/PhysRevB.48.7685
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A neutron-diffraction measurement in the 0-23 angstrom-1 inverse space interval was performed on pure amorphous Si. With the structure factor obtained experimentally three-dimensional models were constructed by reverse Monte Carlo simulation for the determination of the atomic structure of a-Si. The radial distribution function was calculated directly from the large-scale models and was derived traditionally from these wide range spectra, as well.
引用
收藏
页码:7685 / 7688
页数:4
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