STRUCTURE OF EVAPORATED PURE AMORPHOUS-SILICON - NEUTRON-DIFFRACTION AND REVERSE MONTE-CARLO INVESTIGATIONS

被引：84

作者：

KUGLER, S

PUSZTAI, L

ROSTA, L

CHIEUX, P

BELLISSENT, R

机构：

[1] EOTVOS LORAND UNIV, THEORET CHEM LAB, H-1518 BUDAPEST 112, HUNGARY

[2] HUNGARIAN ACAD SCI, CENT RES INST PHYS, H-1525 BUDAPEST, HUNGARY

[3] INST MAX VON LAUE PAUL LANGEVIN, F-38042 GRENOBLE, FRANCE

[4] CENS, LAB LEON BRILLOUIN, F-91191 GIF SUR YVETTE, FRANCE

来源：

PHYSICAL REVIEW B | 1993年 / 48卷 / 10期

关键词：

D O I：

10.1103/PhysRevB.48.7685

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A neutron-diffraction measurement in the 0-23 angstrom-1 inverse space interval was performed on pure amorphous Si. With the structure factor obtained experimentally three-dimensional models were constructed by reverse Monte Carlo simulation for the determination of the atomic structure of a-Si. The radial distribution function was calculated directly from the large-scale models and was derived traditionally from these wide range spectra, as well.

引用

收藏

页码：7685 / 7688

页数：4

相关论文

共 21 条

[1] SYSTEMATIC ANALYSIS OF STRUCTURAL DATA AS A RESEARCH TECHNIQUE IN ORGANIC-CHEMISTRY [J].

ALLEN, FH ;

KENNARD, O ;

TAYLOR, R .

ACCOUNTS OF CHEMICAL RESEARCH, 1983, 16 (05) :146-153

[2] COMPARATIVE-STUDY OF STRUCTURE OF EVAPORATED AND GLOW-DISCHARGE SILICON [J].

BARNA, A ;

BARNA, PB ;

RADNOCZI, G ;

TOTH, L ;

THOMAS, P .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1977, 41 (01) :81-84

[3] THE STRUCTURE OF AMORPHOUS SI-H USING STEADY-STATE AND PULSED NEUTRON SOURCES [J].

BELLISENT, R ;

MENELLE, A ;

HOWELLS, WS ;

WRIGHT, AC ;

BRUNIER, TM ;

SINCLAIR, RN ;

JANSEN, F .

PHYSICA B, 1989, 156 :217-219

[4] STRUCTURE OF AMORPHOUS-SEMICONDUCTORS BY SMALL-ANGLE SCATTERING [J].

BELLISSENT, R .

JOURNAL OF NON-CRYSTALLINE SOLIDS, 1987, 97-8 :329-336

[5] MULTIPLE SCATTERING OF NEUTRONS IN VANADIUM AND COPPER [J].

BLECH, IA ;

AVERBACH, BL .

PHYSICAL REVIEW, 1965, 137 (4A) :1113-&

[6] DETERMINATION OF THE ATOMIC SHORT-RANGE ORDER IN A TB-CU AMORPHOUS ALLOY BY X-RAY AND NEUTRON-DIFFRACTION [J].

CHIEUX, P ;

DEKOUCHKOVSKY, R ;

BOUCHER, B .

JOURNAL OF PHYSICS F-METAL PHYSICS, 1984, 14 (10) :2239-2257

[7] XANES STUDY OF STRUCTURAL DISORDER IN AMORPHOUS-SILICON [J].

DICICCO, A ;

BIANCONI, A ;

COLUZZA, C ;

RUDOLF, P ;

LAGARDE, P ;

FLANK, AM ;

MARCELLI, A .

JOURNAL OF NON-CRYSTALLINE SOLIDS, 1990, 116 (01) :27-32

[8] A NEUTRON-DIFFRACTION STUDY OF THE STRUCTURE OF EVAPORATED AMORPHOUS-GERMANIUM [J].

ETHERINGTON, G ;

WRIGHT, AC ;

WENZEL, JT ;

DORE, JC ;

CLARKE, JH ;

SINCLAIR, RN .

JOURNAL OF NON-CRYSTALLINE SOLIDS, 1982, 48 (2-3) :265-289

[9] SHORT-RANGE ORDER VARIATIONS IN AMORPHOUS-SILICON [J].

FORTNER, J ;

LANNIN, JS .

JOURNAL OF NON-CRYSTALLINE SOLIDS, 1988, 106 (1-3) :128-131

[10] RADIAL-DISTRIBUTION FUNCTIONS OF AMORPHOUS-SILICON [J].

FORTNER, J ;

LANNIN, JS .

PHYSICAL REVIEW B, 1989, 39 (08) :5527-5530