ELECTRICAL-RESISTIVITY OF ALUMINUM BELOW 4.2-K

被引:36
作者
RIBOT, JHJM [1 ]
BASS, J [1 ]
VANKEMPEN, H [1 ]
VANVUCHT, RJM [1 ]
WYDER, P [1 ]
机构
[1] CATHOLIC UNIV NIJMEGEN,MAT RES INST,NIJMEGEN,NETHERLANDS
来源
PHYSICAL REVIEW B | 1981年 / 23卷 / 02期
关键词
D O I
10.1103/PhysRevB.23.532
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:532 / 551
页数:20
相关论文
共 50 条
[21]   DETERMINATION OF THE ELECTRICAL-RESISTIVITY OF SCANDIUM IN ALUMINUM [J].
BERGER, AS .
JOURNAL OF THE LESS-COMMON METALS, 1980, 71 (01) :119-126
[22]   TEMPERATURE-DEPENDENT ELECTRICAL-RESISTIVITY OF POTASSIUM BELOW 2-K [J].
ROWLANDS, JA ;
DUVVURY, C ;
WOODS, SB .
PHYSICAL REVIEW LETTERS, 1978, 40 (18) :1201-1204
[23]   TEMPERATURE CONTROL FOR LIQUID-HELIUM CRYOSTATS BELOW 4.2-K [J].
ESCORNE, M ;
MAUGER, A .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1983, 54 (12) :1693-1696
[24]   TEMPERATURE-DEPENDENCE OF PHONON INTENSITIES IN TANTALUM BELOW 4.2-K [J].
SACCHETTI, F ;
PETRILLO, C ;
MOZE, O .
PHYSICAL REVIEW B, 1994, 49 (13) :8747-8750
[25]   INFLUENCE OF OXYGEN ANNEALING ON ELECTRICAL-RESISTIVITY AND SURFACE SCATTERING OF ELECTRONS IN COPPER WHISKERS AT 4.2 K [J].
THUMMES, G ;
MENDE, HH .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1974, 26 (01) :243-251
[26]   HIGH-PRECISION ELECTRICAL-RESISTIVITY MEASUREMENTS ON POTASSIUM BELOW 1-K [J].
PRATT, WP .
CANADIAN JOURNAL OF PHYSICS, 1982, 60 (05) :703-709
[27]   ELECTRICAL-RESISTIVITY ANISOTROPY OF OSMIUM SINGLE-CRYSTALS IN THE 4.2 TO 300-K RANGE [J].
VOLKENSHTEIN, NV ;
DYAKINA, VP ;
DYAKIN, VV ;
STARTSEV, VE ;
CHEREPANOV, VL ;
AZHAZHA, VM ;
KOVTUN, GP ;
YELENSKII, VA .
FIZIKA NIZKIKH TEMPERATUR, 1981, 7 (09) :1156-1166
[28]   THE ELECTRICAL-RESISTIVITY OF AG AND AG-BASED ALLOYS BELOW 9-K [J].
BARNARD, BR ;
CAPLIN, AD ;
DALIMIN, MNB .
JOURNAL OF PHYSICS F-METAL PHYSICS, 1982, 12 (04) :719-744
[29]   THE ELECTRICAL-RESISTIVITY OF DILUTE ALUMINUM-ALLOYS [J].
BARNARD, RD .
JOURNAL OF PHYSICS F-METAL PHYSICS, 1980, 10 (12) :2749-2752
[30]   ELECTRICAL-RESISTIVITY OF LIQUID ZINC, ALUMINUM AND LEAD [J].
SHARP, AE ;
SMITH, PV .
SOLID STATE COMMUNICATIONS, 1974, 15 (02) :383-386