TECHNOLOGICAL SPILLOVERS THROUGH A PATENT CITATION ANALYSIS

被引:11
作者
Aldieri, Luigi [1 ]
Vinci, Concetto Paolo [2 ]
机构
[1] Univ Naples Parthenope, Dept Business & Econ Studies, Naples, Italy
[2] Univ Salerno, Dept Econ & Stat Sci, Fisciano, Italy
关键词
Innovation; knowledge spillovers; technology transfer; patent citations;
D O I
10.1142/S1363919616500286
中图分类号
C93 [管理学];
学科分类号
12 ; 1201 ; 1202 ; 120202 ;
摘要
The aim of this paper is to analyse the pattern of knowledge flows as evidenced by the patent citations in three economic areas: USA, Japan and Europe. In each economic area, we exploit information from two international patent offices data, the United States Patent and Trademarks Office (USPTO) data and the European Patent Office (EPO) data. In this way, we can investigate the link between the technological proximity and knowledge spillovers for 240 international firms. In particular, the contribution to the existing literature is twofold: First, we use an international sample so that we can compare the empirical results among different economic markets; second, we explore the robustness of results with respect to patent system features. In order to compute the technological proximity, we consider both the symmetrical measure and asymmetrical one. The empirical results indicate that there is a statistically significant correlation between technological proximity and knowledge spillovers measured by patent citations and that these results are robust with respect to patent office data used in the analysis.
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页数:23
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