A NON-DESTRUCTIVE METHOD TO DETERMINE THE STRESS DISTRIBUTIONS OF NEON-IMPLANTED GARNET LAYERS

被引：15

作者：

DEROODE, WH

SMITS, JW

机构：

来源：

关键词：

D O I：

10.1063/1.329203

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：3969 / 3973

页数：5

共 18 条

[1] ALMASI GS, 1974, AIP C P, V24, P630
[2] X-RAY DOUBLE-CRYSTAL DIFFRACTOMETRY OF GA1-XALXAS EPITAXIAL LAYERS
BARTELS, WJ
NIJMAN, W
[J]. JOURNAL OF CRYSTAL GROWTH, 1978, 44 (05) : 518 - 525
[3] DESIGN AND DEVELOPMENT OF SINGLE-LAYER, ION-IMPLANTABLE SMALL BUBBLE MATERIALS FOR MAGNETIC-BUBBLE DEVICES
BLANK, SL
WOLFE, R
LUTHER, LC
LECRAW, RC
NELSON, TJ
BIOLSI, WA
[J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (03) : 2155 - 2160
[4] DEROODE WH, UNPUBLISHED
[5] DETERMINATION OF STRAIN DISTRIBUTIONS FROM X-RAY BRAGG REFLECTION BY SILICON SINGLE-CRYSTALS
FUKUHARA, A
TAKANO, Y
[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1977, 33 (JAN1): : 137 - 142
[6] GIBBONS JF, 1975, PROJECTED RANGE STAT
[7] DIFFERENTIAL ETCHING OF ION-IMPLANTED GARNET
JOHNSON, WA
NORTH, JC
WOLFE, R
[J]. JOURNAL OF APPLIED PHYSICS, 1973, 44 (10) : 4753 - 4757
[8] DETERMINATION OF DOSES FOR ION-IMPLANTATION IN GARNET-FILMS
JOUVE, H
GAILLIARD, JP
PIAGUET, J
[J]. IEEE TRANSACTIONS ON MAGNETICS, 1975, 11 (05) : 1082 - 1084
[9] LIN YS, 1977, IEEE T MAGN, V13, P1744
[10] Mayer J. W., 1970, ION IMPLANTATION SEM