TRANSPORT-PROPERTIES OF YBA2CU3O7-DELTA/Y0.3PR0.7BA2CU3O7-DELTA/YBA2CU3O7-DELTA JOSEPHSON-JUNCTIONS

被引：0

作者：

STOLZEL, C ^{[1
]}

SIEGEL, M ^{[1
]}

ADRIAN, G ^{[1
]}

KRIMMER, C ^{[1
]}

SOLLNER, J ^{[1
]}

WILKENS, W ^{[1
]}

SCHULZ, G ^{[1
]}

ADRIAN, H ^{[1
]}

机构：

[1] DAIMLER BENZ FORSCHUNGSINST,D-60528 FRANKFURT 71,GERMANY

来源：

APPLIED PHYSICS LETTERS | 1993年 / 63卷 / 21期

关键词：

D O I：

暂无

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

YBa2Cu3O7-delta/Y0.3Pr0.7Ba2Cu3O7-delta/YBa2Cu3O7-delta Josephson junctions have been prepared by a multistep laser ablation process using an improved shadow mask technique. Junctions with barrier layer thicknesses larger than 12 nm exhibit current-voltage characteristics which are close to those predicted by the resistively shunted junction (RSJ) model. Under microwave irradiation, clear Shapiro steps, which could be well described by the RSJ model, occur in the current-voltage curves. From the exponential decrease of the critical current density with increasing barrier layer thickness, an order parameter decay length xi(n) of 21 +/- 4 nm at T = 4.2 K has been determined for Y0.3Pr0.7Ba2Cu3O7-delta. The increase of the junction resistance with decreasing temperature indicates that the barrier layer dominates the junction properties.

引用

页码：2970 / 2972

页数：3

共 16 条

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