A HIGH-RESOLUTION POSITION-SENSITIVE X-RAY MWPC FOR SMALL-ANGLE X-RAY-DIFFRACTION

被引：4

作者：

BATEMAN, JE ^{[1
]}

CONNOLLY, JF ^{[1
]}

STEPHENSON, R ^{[1
]}

TAPPERN, GJ ^{[1
]}

机构：

[1] SRC,APPLETON LAB,SLOUGH SL3 9JX,BERKSHIRE,ENGLAND

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1981年 / 190卷 / 02期

关键词：

D O I：

10.1016/0029-554X(81)90303-7

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：385 / 394

页数：10

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