MEASUREMENT OF SMALL DIELECTRIC LOSS AT MICROWAVE-FREQUENCIES

被引：20

作者：

LYNCH, AC

AYERS, S

机构：

来源：

PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON | 1972年 / 119卷 / 06期

关键词：

D O I：

10.1049/piee.1972.0160

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：767 / &

共 50 条

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