X-RAY-DIFFRACTION PROFILE ANALYSIS IN HEXAGONAL CADMIUM FILMS VACUUM-EVAPORATED FROM NORMAL AND OBLIQUE VAPOR INCIDENCE

被引：6

作者：

SEN, S ^{[1
]}

GUPTA, SPS ^{[1
]}

机构：

[1] INDIAN ASSOC CULTIVAT SCI,DEPT GEN PHYS & XRAYS,CALCUTTA 700032,INDIA

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1979年 / 16卷 / 01期

关键词：

D O I：

10.1116/1.569866

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：42 / 53

页数：12

共 50 条

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[7] X-RAY DIFFRACTION STUDY OF VACUUM-EVAPORATED SILVER FILMS
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