X-RAY-DIFFRACTION PROFILE ANALYSIS IN HEXAGONAL CADMIUM FILMS VACUUM-EVAPORATED FROM NORMAL AND OBLIQUE VAPOR INCIDENCE

被引：6
作者：
SEN, S [1 ]
GUPTA, SPS [1 ]
机构：
[1] INDIAN ASSOC CULTIVAT SCI,DEPT GEN PHYS & XRAYS,CALCUTTA 700032,INDIA
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1979年 / 16卷 / 01期
关键词：
D O I：
10.1116/1.569866
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
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页码：42 / 53
页数：12
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