CHARACTERIZATION OF INTERFACIAL ATOMIC STEPS IN GAAS/AIAS SUPERLATTICES BY TRANSMISSION ELECTRON-MICROSCOPY

被引：13

作者：

NAKAMURA, T

IKEDA, M

MUTO, S

UMEBU, I

机构：

来源：

APPLIED PHYSICS LETTERS | 1988年 / 53卷 / 05期

关键词：

D O I：

10.1063/1.99899

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：379 / 381

页数：3

共 11 条

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[8] TRANSMISSION ELECTRON-MICROSCOPE OBSERVATION OF LATTICE IMAGE OF ALXGA1-XAS-ALYGA1-YAS SUPERLATTICES WITH HIGH CONTRAST [J].

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