CAPTURE AND RECOMBINATION AT MULTIELECTRON CAPTURE CENTERS IN SEMICONDUCTORS

[1] AIGRAIN P, 1954, ANN RADIOELEC COMPAG, V9, P219

[2] PHOTOCONDUCTIVE AND PHOTOELECTROMAGNETIC LIFETIME DETERMINATION IN PRESENCE OF TRAPPING .1. SMALL SIGNALS [J]. PHYSICAL REVIEW, 1959, 116 (04): : 793 - 802

[3] BERNARD M, 1958, J ELECTRON CONTR, V5, P15

[4] GRINBERG AA, FIZ TVERD TELA

[5] GURO GM, 1959, FIZ TVERD TELA, V1, P3

[6] HOFFMANN A, 1956, HALBLEITERPROBLEME B, V2, P129

[7] PHOTOCONDUCTIVE AND PHOTOELECTROMAGNETIC EFFECTS IN INSB [J]. JOURNAL OF APPLIED PHYSICS, 1956, 27 (03) : 278 - 285

[8] A CONTRIBUTION TO THE RECOMBINATION STATISTICS OF EXCESS CARRIERS IN SEMICONDUCTORS [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1957, 70 (03): : 282 - 296

[9] MIRONOV AG, 1959, FIZ TVERD TELA, V1, P525

[10] ELECTRON-HOLE RECOMBINATION STATISTICS IN SEMICONDUCTORS THROUGH FLAWS WITH MANY CHARGE CONDITIONS [J]. PHYSICAL REVIEW, 1958, 109 (04): : 1103 - 1115

[1] AIGRAIN P, 1954, ANN RADIOELEC COMPAG, V9, P219

[2] PHOTOCONDUCTIVE AND PHOTOELECTROMAGNETIC LIFETIME DETERMINATION IN PRESENCE OF TRAPPING .1. SMALL SIGNALS [J]. PHYSICAL REVIEW, 1959, 116 (04): : 793 - 802

[3] BERNARD M, 1958, J ELECTRON CONTR, V5, P15

[4] GRINBERG AA, FIZ TVERD TELA

[5] GURO GM, 1959, FIZ TVERD TELA, V1, P3

[6] HOFFMANN A, 1956, HALBLEITERPROBLEME B, V2, P129

[7] PHOTOCONDUCTIVE AND PHOTOELECTROMAGNETIC EFFECTS IN INSB [J]. JOURNAL OF APPLIED PHYSICS, 1956, 27 (03) : 278 - 285

[8] A CONTRIBUTION TO THE RECOMBINATION STATISTICS OF EXCESS CARRIERS IN SEMICONDUCTORS [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1957, 70 (03): : 282 - 296

[9] MIRONOV AG, 1959, FIZ TVERD TELA, V1, P525

[10] ELECTRON-HOLE RECOMBINATION STATISTICS IN SEMICONDUCTORS THROUGH FLAWS WITH MANY CHARGE CONDITIONS [J]. PHYSICAL REVIEW, 1958, 109 (04): : 1103 - 1115