AC ELECTRON TUNNELING AT INFRARED FREQUENCIES - THIN-FILM M-O-M DIODE STRUCTURE WITH BROAD-BAND CHARACTERISTICS

被引：80
作者：
SMALL, JG
ELCHINGER, GM
JAVAN, A
SANCHEZ, A
BACHNER, FJ
SMYTHE, DL
机构：
[1] MIT, DEPT PHYS, CAMBRIDGE, MA 02139 USA
[2] USAF, COMBRIDGE RES LAB, LG HANSCOMB FIELD, BEDFORD, MA 01730 USA
[3] MIT, LINCOLN LAB, LEXINGTON, MA 02173 USA
来源：
APPLIED PHYSICS LETTERS | 1974年 / 24卷 / 06期
关键词：
D O I：
10.1063/1.1655181
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：275 / 279
页数：5
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