CHARGING OF SPACECRAFT MATERIALS SIMULATED IN A SCANNING ELECTRON MICROSCOPE

被引：3
|
作者：
BALMAIN, KG [1 ]
机构：
[1] UNIV TORONTO,DEPT ELECTR ENGN,TORONTO M5S 1A4,ONTARIO,CANADA
来源：
ELECTRONICS LETTERS | 1973年 / 9卷 / 23期
关键词：
Engineering Village;
D O I：
10.1049/el:19730401
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：544 / 546
页数：3
相关论文
共 50 条
  • [1] CHARGING EFFECTS IN SCANNING ELECTRON MICROSCOPE
    SHAFFNER, TJ
    VANVELD, RD
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1971, 4 (SEP): : 633 - &
  • [2] Charging/discharge events in coated spacecraft polymers during electron beam irradiation in a scanning electron microscope
    Czeremuszkin, G
    Latrèche, M
    Wertheimer, MR
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2001, 185 : 88 - 99
  • [3] SIMSEM - A SIMULATED SCANNING ELECTRON-MICROSCOPE
    CRAWFORD, D
    GERNEKE, DA
    SCANNING, 1983, 5 (04) : 190 - 193
  • [4] ELIMINATION OF CHARGING ARTIFACTS IN SCANNING ELECTRON-MICROSCOPE
    ROBINSON, VNE
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1975, 8 (08): : 638 - 640
  • [5] Charging identification and compensation in the scanning electron microscope.
    Wong, WK
    Thong, JTL
    Phang, JCH
    PROCEEDINGS OF THE 1997 6TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS, 1997, : 97 - 102
  • [6] Model improvements to simulate charging in scanning electron microscope
    Arat, Kerim T.
    Klimpel, Thomas
    Hagen, Cornelis W.
    JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS, 2019, 18 (04):
  • [7] Reduction of charging effects using vector scanning in the scanning electron microscope
    Thong, JTL
    Lee, KW
    Wong, WK
    SCANNING, 2001, 23 (06) : 395 - 402
  • [8] ELECTRICAL CHARGING OF PERCOLATING SAMPLES IN THE SCANNING ELECTRON-MICROSCOPE
    BARKAY, Z
    DWIR, B
    DEUTSCHER, G
    GRUNBAUM, E
    APPLIED PHYSICS LETTERS, 1989, 55 (26) : 2787 - 2789
  • [9] Charging of deformed semicrystalline polymers observed with a scanning electron microscope
    Gong, H
    Chooi, KM
    Ong, CK
    IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 1995, 2 (06) : 1123 - 1131
  • [10] Examining composite materials with the scanning electron microscope
    DAVIS LW
    LONG JR
    1600, (12):
12345