FABRICATION OF X-RAY MASKS USING ANISOTROPIC ETCHING OF (110) SI AND SHADOWING TECHNIQUES

被引:14
作者
TSUMITA, N
MELNGAILIS, J
HAWRYLUK, AM
SMITH, HI
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1981年 / 19卷 / 04期
关键词
D O I
10.1116/1.571246
中图分类号
O59 [应用物理学];
学科分类号
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页码:1211 / 1213
页数:3
相关论文
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[2]   X-RAY-LITHOGRAPHY AT - 100-A LINEWIDTHS USING X-RAY MASKS FABRICATED BY SHADOWING TECHNIQUES [J].
FLANDERS, DC .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (06) :1615-1619
[4]   RECTANGULAR-PROFILE DIFFRACTION GRATING FROM SINGLE-CRYSTAL SILICON [J].
JOSSE, M ;
KENDALL, DL .
APPLIED OPTICS, 1980, 19 (01) :72-76
[5]   VERTICAL ETCHING OF SILICON AT VERY HIGH ASPECT RATIOS [J].
KENDALL, DL .
ANNUAL REVIEW OF MATERIALS SCIENCE, 1979, 9 :373-403