MEASUREMENTS OF RETURN LOSS ON OEIC STRUCTURES, USING OPTICAL LOW-COHERENCE REFLECTOMETRY

被引：0
|
作者：
FOSTER, GM
机构：
来源：
OPTICAL AND QUANTUM ELECTRONICS | 1995年 / 27卷 / 11期
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D O I：
10.1007/BF00292137
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Optical low-coherence reflectometry (OLCR) has been applied for the first time to the evaluation of optoelectronic integrated circuits (OEICs). Benefits are demonstrated for analysis and measurement of integrated structures. In particular reflection strengths of various integrated devices and interfaces on real fibred OEICs have been quantified.
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页码：1075 / 1079
页数：5
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