STABILITY AND DETERIORATION MECHANISM OF THICK-FILM RESISTORS

被引：6
|
作者：
TAKETA, Y [1 ]
HARADOME, M [1 ]
机构：
[1] NIHON UNIV,PHYS SCI LABS,7-1591 NARASHINODAI,JAPAN
来源：
MICROELECTRONICS AND RELIABILITY | 1974年 / 13卷 / 04期
关键词：
D O I：
10.1016/0026-2714(74)90107-3
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：281 / 289
页数：9
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