STABILITY AND DETERIORATION MECHANISM OF THICK-FILM RESISTORS

被引：6

|

作者：

TAKETA, Y ^{[1
]}

HARADOME, M ^{[1
]}

机构：

[1] NIHON UNIV,PHYS SCI LABS,7-1591 NARASHINODAI,JAPAN

来源：

MICROELECTRONICS AND RELIABILITY | 1974年 / 13卷 / 04期

关键词：

D O I：

10.1016/0026-2714(74)90107-3

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：281 / 289

页数：9

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