PROCESS AND DISTURBANCE IDENTIFICATION BY CURVE FITTING THE CLOSED-LOOP RESPONSE

被引：0
作者：
HILL, AG
RAKSAKIJ, W
机构：
来源：
PROCEEDINGS OF THE 1989 AMERICAN CONTROL CONFERENCE, VOLS 1-3 | 1989年
关键词：
D O I：
暂无
中图分类号：
V [航空、航天];
学科分类号：
08 ; 0825 ;
摘要：
引用
收藏
页码：2206 / 2209
页数：4
相关论文
共 50 条
[21]   Closed-loop Identification of Infrared Oven in HDD Manufacturing Process [J].
Srisertpol, Jiraphon ;
Phungphimai, Supot .
CCDC 2009: 21ST CHINESE CONTROL AND DECISION CONFERENCE, VOLS 1-6, PROCEEDINGS, 2009, :2385-2389
[22]   Valve friction and nonlinear process model closed-loop identification [J].
Romano, Rodrigo Alvite ;
Garcia, Claudio .
JOURNAL OF PROCESS CONTROL, 2011, 21 (04) :667-677
[23]   EFFECT OF DISTURBANCE DIRECTIONS ON CLOSED-LOOP PERFORMANCE [J].
SKOGESTAD, S ;
MORARI, M .
INDUSTRIAL & ENGINEERING CHEMISTRY RESEARCH, 1987, 26 (10) :2029-2035
[24]   Closed-loop step response identification of integrating and unstable processes [J].
Liu, Tao ;
Gao, Furong .
CHEMICAL ENGINEERING SCIENCE, 2010, 65 (10) :2884-2895
[25]   On-Line Identification of Process Models in Closed-Loop Material Testing [J].
Lee, S. R. ;
Srinivasan, K. .
JOURNAL OF DYNAMIC SYSTEMS MEASUREMENT AND CONTROL-TRANSACTIONS OF THE ASME, 1989, 111 (02) :172-179
[26]   Closed-loop identification of wafer temperature dynamics in a rapid thermal process [J].
Cho, WH ;
Edgar, TF ;
Lee, J .
KOREAN JOURNAL OF CHEMICAL ENGINEERING, 2006, 23 (02) :171-175
[27]   Closed-loop identification of second order dead time process models [J].
Krishnaswamy, PR ;
Rangaiah, GP .
CHEMICAL ENGINEERING RESEARCH & DESIGN, 1996, 74 (A1) :30-34
[28]   Closed-loop identification of wafer temperature dynamics in a rapid thermal process [J].
Wonhui Cho ;
Thomas F. Edgar ;
Jietae Lee .
Korean Journal of Chemical Engineering, 2006, 23 :171-175
[29]   Closed-loop identification method of sintering process with part of the inputs controlled [J].
Wang Chun-sheng ;
Wu Min .
CEIS 2011, 2011, 15
[30]   Closed-loop on-line process identification using a proportional controller [J].
Park, JH ;
Park, HI ;
Lee, IB .
CHEMICAL ENGINEERING SCIENCE, 1998, 53 (09) :1713-1724
12345