SCANNING-TUNNELING-MICROSCOPY IMAGING OF CONDUCTING LANGMUIR-BLODGETT-FILMS

被引：8
作者：
MULE, M [1 ]
STUSSI, E [1 ]
DEROSSI, D [1 ]
BERZINA, TS [1 ]
TROITSKY, VI [1 ]
机构：
[1] ZELENOGRAD PHYS PROBLEMS RES INST,MOSCOW 103460,RUSSIA
来源：
THIN SOLID FILMS | 1994年 / 237卷 / 1-2期
关键词：
D O I：
10.1016/0040-6090(94)90265-8
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Atomic resolution imaging of Langmuir-Blodgett highly-conductive, environmentally-stable organic films of charge-transfer salts has been obtained by scanning tunnelling microscopy (STM) showing their closely packed structure. By means of a comparative study with images of highly oriented pyrolytic graphite, the intermolecular distances have been calculated taking into account several types of measurement error. The structural data derived from STM have been compared with those obtained from electron diffraction studies. The electrical properties of these films together with the ''read and write'' capabilities of STM could provide a basis for fabricating nanoelectronic devices.
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收藏
页码：225 / 230
页数：6
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