STRUCTURAL STUDIES OF OXYNITRIDE GLASSES VIA X-RAY PHOTOELECTRON-SPECTROSCOPY

被引:0
作者
WITTBERG, TN
LOEHMAN, RE
PANTANO, CG
机构
[1] UNIV DAYTON,DAYTON,OH 45469
[2] SRI INT,MENLO PK,CA 94025
[3] PENN STATE UNIV,UNIVERSITY PK,PA 16802
来源
AMERICAN CERAMIC SOCIETY BULLETIN | 1981年 / 60卷 / 08期
关键词
D O I
暂无
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:861 / 861
页数:1
相关论文
共 50 条
[31]   CHARGING EFFECTS IN X-RAY PHOTOELECTRON-SPECTROSCOPY [J].
CROS, A .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1992, 59 (01) :1-14
[32]   X-RAY PHOTOELECTRON-SPECTROSCOPY OF COPPER(III) [J].
BROWN, DG ;
WESER, U .
HOPPE-SEYLERS ZEITSCHRIFT FUR PHYSIOLOGISCHE CHEMIE, 1979, 360 (09) :1135-1135
[33]   X-RAY PHOTOELECTRON-SPECTROSCOPY OF ETCHED ZNSE [J].
MCGEE, TF ;
CORNELISSEN, HJ .
APPLIED SURFACE SCIENCE, 1989, 35 (03) :371-379
[34]   INELASTIC EFFECTS IN X-RAY PHOTOELECTRON-SPECTROSCOPY [J].
SUNJIC, M ;
SOKCEVIC, D .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 5 (NOV-D) :963-982
[35]   THE NIST X-RAY PHOTOELECTRON-SPECTROSCOPY DATABASE [J].
RUMBLE, JR ;
BICKHAM, DM ;
POWELL, CJ .
SURFACE AND INTERFACE ANALYSIS, 1992, 19 (1-12) :241-246
[36]   X-RAY PHOTOELECTRON-SPECTROSCOPY OF SOME SILICATES [J].
CLARKE, TA ;
RIZKALLA, EN .
CHEMICAL PHYSICS LETTERS, 1976, 37 (03) :523-526
[37]   X-RAY PHOTOELECTRON-SPECTROSCOPY OF PHTHALOCYANINE COMPOUNDS [J].
OUEDRAOGO, GV ;
BENLIAN, D ;
PORTE, L .
JOURNAL OF CHEMICAL PHYSICS, 1980, 73 (02) :642-647
[38]   X-RAY PHOTOELECTRON-SPECTROSCOPY OF SPIROPYRAN MOLECULES [J].
PIGOIS, E ;
GAYOT, D ;
DELAMAR, M ;
LECLERC, M ;
CHEHIMI, MM .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1990, 53 (1-2) :79-86
[39]   X-RAY PHOTOELECTRON-SPECTROSCOPY OF CESIUM URANATES [J].
ALRAYYES, AH ;
RONNEAU, C .
RADIOCHIMICA ACTA, 1991, 54 (04) :189-191
[40]   X-RAY PHOTOELECTRON-SPECTROSCOPY OF HAFNIUM NITRIDE [J].
BRUNINX, E ;
VANEENBERGEN, AFPM ;
VANDERWERF, P ;
HAISMA, J .
JOURNAL OF MATERIALS SCIENCE, 1986, 21 (02) :541-546