COAXIAL CHAMBER FOR MEASUREMENT OF FREQUENCY-DEPENDENT CONDUCTIVITY IN POWDERED SEMICONDUCTORS

被引：7
|
作者：
SNOWDEN, DP
SALTSBURG, H
机构：
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1963年 / 34卷 / 11期
关键词：
D O I：
10.1063/1.1718200
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：1263 / &
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