METHOD FOR PERFORMING HIGH PRECISION LATTICE-PARAMETER CHANGE MEASUREMENTS ON QUENCHED ALUMINUM

被引：1

|

作者：

EUBIG, C

TOMIZUKA, CT

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1972年 / 43卷 / 12期

关键词：

D O I：

10.1063/1.1685570

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：1804 / &

相关论文

共 50 条

[1] PRECISION LATTICE-PARAMETER MEASUREMENTS
KEITH, HD
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1950, 63 (372): : 1034 - 1036
[2] METHOD FOR PRECISION MEASUREMENT OF A LATTICE-PARAMETER
BRAZGIN, IA
ZEZYULINA, LF
DANILOV, VF
INDUSTRIAL LABORATORY, 1971, 37 (09): : 1400 - +
[3] HIGH-PRECISION LATTICE-PARAMETER MEASUREMENTS ON GALLIUMARSENID BY NEUTRON BACKSCATTERING
MULLER, G
BISCHOF, B
ALEFELD, B
PHYSICA B-CONDENSED MATTER, 1992, 180 : 609 - 611
[4] AUTOMATED PRECISION LATTICE-PARAMETER MEASUREMENTS ON SINGLE-CRYSTALS
FEHMER, HH
SCHWUTTK.GH
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1973, 18 (03): : 476 - 477
[5] PRECISION LATTICE-PARAMETER MEASUREMENTS OF VPE-GAP-EPITAXIAL LAYERS BY UMWEGANREGUNG METHOD
BRUHL, HG
KRISTALL UND TECHNIK-CRYSTAL RESEARCH AND TECHNOLOGY, 1978, 13 (10): : 1247 - 1251
[6] HIGH-PRECISION MEASUREMENTS OF LATTICE-PARAMETER CHANGES IN NEUTRON-IRRADIATED COPPER
LARSON, BC
JOURNAL OF APPLIED PHYSICS, 1974, 45 (02) : 514 - 518
[7] A METHOD FOR PRECISION LATTICE-PARAMETER MEASUREMENT OF SINGLE-CRYSTALS
BERGER, H
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1984, 17 (DEC) : 451 - 455
[8] Comparison of lattice-parameter and resistivity change in electron-irradiated aluminum
Wagner, H.
Dworschak, F.
Schilling, W.
PHYSICAL REVIEW B-SOLID STATE, 1970, 2 (10): : 3856 - 3863
[9] LATTICE-PARAMETER MEASUREMENTS IN EPITAXIC LAYERS
LIND, MD
GERTNER, ER
RODE, JP
ANDREWS, AM
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1978, 11 (OCT) : 671 - 671
[10] DISCUSSION OF ERROR IN LATTICE-PARAMETER MEASUREMENTS
WEYERER, H
ACTA CRYSTALLOGRAPHICA, 1960, 13 (10): : 821 - 823

← 1 2 3 4 5 →