THE EFFECT OF FILM THICKNESS ON THE OPTICAL-PROPERTIES OF LEAD-TELLURIDE

被引：8
作者：
ELOCKER, MM
SHARAF, F
TALAAT, HM
METAWE, F
ELSHERBINY, MA
机构：
[1] SUEZ CANAL UNIV,FAC SCI,ISMAILIA,EGYPT
[2] BANHA UNIV,FAC ENGN,SHOBRA,EGYPT
来源：
SOLID STATE COMMUNICATIONS | 1990年 / 76卷 / 11期
关键词：
D O I：
10.1016/0038-1098(90)90578-Y
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Thin films of PbTe have been prepared by thermal evaporation under vacuum of ∼1.3×10-3 Pa. The thickness of the films ranged between ∼200 and ∼700 nm. X-ray diffraction patterns reveal the formation of polycrystalline films. Optical gap has been estimated and was found that it lies at about 0.3 eV for all films. Ellepsometry shows the presence of two absorption peaks at about 1.45 eV and 2.6 eV. The obtained results are discussed in terms of the band structure of PbTe. © 1990.
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页码：1293 / 1296
页数：4
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