MODULATION ELLIPSOMETRY AND ITS APPLICATION TO STUDY OF ELECTRODE-ELECTROLYTE INTERFACE

被引：53

作者：

CAHAN, BD ^{[1
]}

HORKANS, J ^{[1
]}

YEAGER, E ^{[1
]}

机构：

[1] CASE WESTERN RESERVE UNIV,DEPT CHEM,CLEVELAND,OH 44106

来源：

SURFACE SCIENCE | 1973年 / 37卷 / 01期

关键词：

D O I：

10.1016/0039-6028(73)90346-4

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：559 / 567

页数：9

共 16 条

[1]

BARRETT MA, 1970, S FARADAY SOC, V4, P72

[2] ANODIC FORMATION OF CALOMEL FILMS ON MERCURY ELECTRODES - ELLIPSOMETRIC-GALVANOSTATIC STUDY [J].

BOCKRIS, JO ;

DEVANATHAN, MAV ;

REDDY, AKN .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1964, 279 (1376) :327-+

[3]

BORN M, 1970, PRINCIPLES OPTICS

[4] APPLICATION OF INTENSITY TRANSIENTS IN ELLIPSOMETRY [J].

BRUSIC, V ;

GENSHAW, MA ;

CAHAN, BD .

APPLIED OPTICS, 1970, 9 (07) :1634-&

[5] MODULATED ELLIPSOMETRY FOR BAND STRUCTURE STUDIES OF SOLIDS AND FILMS [J].

BUCKMAN, AB .

SURFACE SCIENCE, 1969, 16 :193-&

[6] A HIGH SPEED PRECISION AUTOMATIC ELLIPSOMETER [J].

CAHAN, BD ;

SPANIER, RF .

SURFACE SCIENCE, 1969, 16 :166-&

[7]

CAHAN BD, TO BE PUBLISHED

[8] A HIGH PRECISION PHOTOELECTRIC ELLIPSOMETER [J].

JERRARD, HG .

SURFACE SCIENCE, 1969, 16 :137-&

[9] CIRCUIT DESIGN FOR AN ELECTRONIC SELF-NULLING ELLIPSOMETER [J].

LAYER, HP .

SURFACE SCIENCE, 1969, 16 :177-&

[10] AN ELLIPSOMETER FOR FOLLOWING FILM GROWTH [J].

ORD, JL .

SURFACE SCIENCE, 1969, 16 :155-&

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