NANOMETER-SCALE MORPHOLOGY OF HOMOEPITAXIAL DIAMOND FILMS BY ATOMIC FORCE MICROSCOPY

被引:49
|
作者
SUTCU, LF
THOMPSON, MS
CHU, CJ
HAUGE, RH
MARGRAVE, JL
DEVELYN, MP
机构
[1] RICE UNIV,RICE QUANTUM INST,HOUSTON,TX 77251
[2] DIGITAL INSTRUMENTS INC,SANTA BARBARA,CA 93117
[3] HOUSTON ADV RES CTR,THE WOODLANDS,TX 77381
关键词
D O I
10.1063/1.107237
中图分类号
O59 [应用物理学];
学科分类号
摘要
We present the first atomic force microscopy images of diamond films grown homoepitaxially in a hot filament reactor on (100), (111), and (110) natural diamond substrates. (100)-oriented diamond films grown with 0.3% CH4 at a substrate temperature of 810-degrees-C were rough on the micron scale, exhibiting pyramidal features and penetration twins, while films grown with 1.6% CH4 at 1000-degrees-C were nearly atomically smooth and showed evidence of a (2 X 1) reconstruction. A (111)-oriented film cracked due to tensile stress and was rough on the 50-500 nm scale, while a (110)-oriented film was rough on the micron scale but nearly atomically smooth on the 0.5-5 nm scale. Implications of the observed morphologies for diamond growth mechanisms are discussed.
引用
收藏
页码:1685 / 1687
页数:3
相关论文
共 50 条
  • [1] Nanometer-scale dimensional metrology with noncontact atomic force microscopy
    Marchman, H
    METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY X, 1996, 2725 : 527 - 539
  • [2] Atomic force microscopy investigation of nanometer-scale modifications of polymer morphology caused by ultraviolet irradiation
    Nowicki, M
    Kaczmarek, H
    Czajka, R
    Susla, B
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 2000, 18 (05): : 2477 - 2481
  • [3] Nanometer-scale lithography of ultrathin films with atomic force microscope
    Kim, J
    Lee, H
    Shin, Y
    Park, S
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 1998, 33 : S84 - S86
  • [4] ATOMIC FORCE MICROSCOPY OF (100), (110), AND (111) HOMOEPITAXIAL DIAMOND FILMS
    SUTCU, LF
    CHU, CJ
    THOMPSON, MS
    HAUGE, RH
    MARGRAVE, JL
    DEVELYN, MP
    JOURNAL OF APPLIED PHYSICS, 1992, 71 (12) : 5930 - 5940
  • [5] NANOMETER-SCALE RECORDING ON CHALCOGENIDE FILMS WITH AN ATOMIC-FORCE MICROSCOPE
    KADO, H
    TOHDA, T
    APPLIED PHYSICS LETTERS, 1995, 66 (22) : 2961 - 2962
  • [6] STRUCTURAL OBSERVATION OF CDST(2) LB FILMS AND NANOMETER-SCALE LITHOGRAPHY BY ATOMIC-FORCE MICROSCOPY
    YANG, XM
    WEI, Y
    CHINESE SCIENCE BULLETIN, 1995, 40 (10): : 845 - 849
  • [7] Nanometer-scale characterization of ferroelectric polymer thin films by variable-temperature atomic force microscopy
    Fukuma, T
    Kobayashi, K
    Horiuchi, T
    Yamada, H
    Matsushige, K
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (6B): : 3830 - 3833
  • [8] Nanometer-scale characterization of ferroelectric polymer thin films by variable-temperature atomic force microscopy
    Fukuma, Takeshi
    Kobayashi, Kei
    Horiuchi, Toshihisa
    Yamada, Hirofumi
    Matsushige, Kazumi
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2000, 39 (6 B): : 3830 - 3833
  • [9] The nanometer-scale structure of amyloid-beta visualized by atomic force microscopy
    Stine, WB
    Snyder, SW
    Ladror, US
    Wade, WS
    Miller, MF
    Perun, TJ
    Holzman, TF
    Krafft, GA
    JOURNAL OF PROTEIN CHEMISTRY, 1996, 15 (02): : 193 - 203
  • [10] Measurements of electrical conductivity of a nanometer-scale water meniscus by Atomic Force Microscopy
    Martín, C
    Murano, FP
    Dagata, JA
    2003 THIRD IEEE CONFERENCE ON NANOTECHNOLOGY, VOLS ONE AND TWO, PROCEEDINGS, 2003, : 781 - 784