HIGH-TEMPERATURE AUGER-ELECTRON SPECTROSCOPY

被引：19

作者：

BAS, EB ^{[1
]}

BANNINGER, U ^{[1
]}

机构：

[1] SWISS FED INST TECHNOL, INST APPL PHYS, POSTFACH, 8049 ZURICH, SWITZERLAND

来源：

SURFACE SCIENCE | 1974年 / 41卷 / 01期

关键词：

D O I：

10.1016/0039-6028(74)90292-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：1 / 10

页数：10

共 19 条

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REVIEW OF SCIENTIFIC INSTRUMENTS, 1970, 41 (03) :351-&

[3] EXPERIMENTAL INVESTIGATION OF CYLINDRICAL MIRROR ANALYZER WITH 2PI-THERMIONIC ELECTRON SOURCE [J].

BAS, EB ;

BANNINGE.U ;

KELLER, P .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1972, 9 (01) :306-&

[4]

BAS EB, 1955, Z ANGEW PHYS, V7, P337

[5] ZUR ENERGIEVERTEILUNG DER VON PROTONEN IN GASEN AUSGELOSTEN SEKUNDARELEKTRONEN [J].

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[6]

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[7] ADSORPTION STUDIES BASED ON THERMIONIC EMISSION MEASUREMENTS .2. OXYGEN ON SINGLE-CRYSTAL TUNGSTEN [J].

ENGELMAI.W ;

STICKNEY, RE .

SURFACE SCIENCE, 1968, 11 (03) :370-&

[8] ADSORPTION AND DIFFUSION OF OXYGEN ON TUNGSTEN [J].

GOMER, R ;

HULM, JK .

JOURNAL OF CHEMICAL PHYSICS, 1957, 27 (06) :1363-1376

[9]

HAAS TW, 1972, ADSORPTION DESORPTIO

[10] COMPARISON OF SPHERICAL DEFLECTOR AND CYLINDRICAL MIRROR ANALYZERS [J].

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SIMPSON, JA ;

KUYATT, CE .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (01) :33-&

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