ROLE OF TEST CHIPS IN COORDINATING LOGIC AND CIRCUIT-DESIGN AND LAYOUT AIDS FOR VLSI

被引：0

作者：

BUEHLER, MG ^{[1
]}

LINHOLM, LW ^{[1
]}

机构：

[1] NBS,WASHINGTON,DC 20234

来源：

SOLID STATE TECHNOLOGY | 1981年 / 24卷 / 09期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

INTEGRATED CIRCUITS - Very Large Scale Integration

引用

页码：68 / 74

页数：7

共 24 条

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IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1979, 14 (03) :613-621

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