RELIABILITY TESTING OF TRIACS

被引:2
作者
SAMPLE, SB
SCHEUER, PR
SILVA, LF
机构
[1] DESIGN & MANUFACTURING CORP,W LAFAYETTE,IN 47906
[2] PURDUE UNIV,SCH ELECTR ENGN,W LAFAYETTE,IN 47907
关键词
D O I
10.1109/TIA.1977.4503400
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:254 / 259
页数:6
相关论文
共 7 条
  • [1] 2-TERMINAL ASYMMETRICAL AND SYMMETRICAL SILICON NEGATIVE RESISTANCE SWITCHES
    ALDRICH, RW
    HOLONYAK, N
    [J]. JOURNAL OF APPLIED PHYSICS, 1959, 30 (11) : 1819 - 1824
  • [2] BIDIRECTIONAL TRIODE P-N-P-N SWITCHES
    GENTRY, FE
    SCACE, RI
    FLOWERS, JK
    [J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1965, 53 (04): : 355 - &
  • [3] GENTRY FE, 1964, SEMICONDUCTOR CONTRO
  • [4] GUTZWILLER FW, 1967, GENERAL ELECTRIC SCR
  • [5] MCNULTY TC, 1970, AN4242 RCA APPL NOT
  • [6] ALL-SOLID-STATE DIGITAL CONTROL SYSTEM FOR APPLIANCES
    SAMPLE, SB
    SCHEUER, PR
    YAKE, WH
    ZANE, VH
    [J]. IEEE TRANSACTIONS ON INDUSTRY AND GENERAL APPLICATIONS, 1970, IGA6 (06): : 669 - &
  • [7] 1973, SEMICONDUCTOR DATA H