DETERMINATION OF THE NUMBER OF IONS IN THE OXFORD ELECTRON-BEAM ION-TRAP

被引：8
|
作者：
MARGOLIS, HS [1 ]
VARNEY, AJ [1 ]
JARJIS, RA [1 ]
SILVER, JD [1 ]
机构：
[1] UNIV OXFORD,DEPT PHYS,OXFORD OX1 3PU,ENGLAND
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1995年 / 98卷 / 1-4期
关键词：
D O I：
10.1016/0168-583X(95)00012-7
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
In order to determine absolute numbers of ions trapped in the Oxford electron beam ion trap (EBIT), the efficiency of a lithium-drifted silicon X-ray detector has been characterized over the energy range 1.5-15 keV using the Oxford scanning proton microprobe. Preliminary results for the number densities of neon-like barium and highly charged argon ions are presented.
引用
收藏
页码：562 / 565
页数：4
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