Applications of the Scanning Electron Microscope in Materials Science

被引：9

作者：

Minkoff, I. ^{[1
]}

机构：

[1] Technion, Dept Met, Haifa, Israel

来源：

JOURNAL OF MATERIALS SCIENCE | 1967年 / 2卷 / 04期

关键词：

D O I：

10.1007/BF00572424

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The commercial manufacture of scanning electron miscroscopes and their introduction into experimental research programmes has led to an increasing appreciation of the application of this type of instrument in materials science. Some account of their employment is presented here, the varying applications indicating clearly the importance of the instrument and its potential for both research and control.

引用

页码：388 / 394

页数：7

共 50 条

[1] APPLICATIONS OF THE SCANNING REFLECTION ACOUSTIC MICROSCOPE TO THE STUDY OF MATERIALS SCIENCE
WEAVER, JMR
SOMEKH, MG
BRIGGS, GAD
PECK, SD
ILETT, C
IEEE TRANSACTIONS ON SONICS AND ULTRASONICS, 1985, 32 (02): : 302 - 312
[2] APPLICATIONS OF THE ENVIRONMENTAL SCANNING ELECTRON-MICROSCOPE TO CONSERVATION SCIENCE
DOEHNE, E
STULIK, DC
SCANNING MICROSCOPY, 1990, 4 (02) : 275 - 286
[3] Insights into Materials Science with the Scanning Electron Microscope (SEM) - Series #3
Lupatsch, Stefan
Schenke, Pia
WOCHENBLATT FUR PAPIERFABRIKATION, 2022, 150 (12): : S27 - S27
[4] Insights into Materials Science with the Scanning Electron Microscope (SEM) - Series 5
Schenke, Pia
Lupatsch, Stefan
WOCHENBLATT FUR PAPIERFABRIKATION, 2024, 152 (09):
[5] Insights into Materials Science with the Scanning Electron Microscope (SEM) - Series 2
Schenke, Pia
Lupatsch, Stefan
WOCHENBLATT FUR PAPIERFABRIKATION, 2021, 149 (11): : 22 - 22
[6] Insights into Materials Science with the Scanning Electron Microscope (SEM) - Series #4
Schenke, Pia
Lupatsch, Stefan
WOCHENBLATT FUR PAPIERFABRIKATION, 2023, 151 (09):
[7] Insights into Materials Science with the Scanning Electron Microscope (SEM) - Series #1
Schenke, Pia
Lupatsch, Stefan
WOCHENBLATT FUR PAPIERFABRIKATION, 2020, 148 (12): : 17 - 17
[8] SOME APPLICATIONS OF SCANNING ELECTRON MICROSCOPE IN MATERIAL SCIENCE AND TECHNOLOGY.
Das, N.K.
Sinha, A.N.
Bose, S.K.
Kumar, R.
TISCO (Tata Iron and Steel Co), 1977, 24 (03): : 105 - 108
[9] Some new applications of the scanning electron acoustic microscope for materials evaluation
Jiang, FM
Kojima, S
Zhang, BY
Yin, QR
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1998, 37 (5B): : 3128 - 3131
[10] The fiftieth anniversary of the first applications of the scanning electron microscope in materials research
Smith, Kenneth C. A.
Wells, Oliver C.
McMullan, Dennis
PROCEEDINGS OF THE SEVENTH INTERNATIONAL CONFERENCE ON CHARGED PARTICLE OPTICS (CPO-7), 2008, 1 (01): : 3 - 12

← 1 2 3 4 5 →