IMPROVE ACCURACY OF ON-WAFER TESTS VIA LRM CALIBRATION

被引：0
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作者：
LAUTZENHISER, S
DAVIDSON, A
JONES, K
机构：
来源：
MICROWAVES & RF | 1990年 / 29卷 / 01期
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
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页码：105 / &
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