THEORY OF TRANSITION FROM THE TUNNELING REGIME TO POINT CONTACT IN SCANNING TUNNELING MICROSCOPY

被引:72
作者
CIRACI, S
TEKMAN, E
机构
来源
PHYSICAL REVIEW B | 1989年 / 40卷 / 17期
关键词
D O I
10.1103/PhysRevB.40.11969
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
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页码:11969 / 11972
页数:4
相关论文
共 21 条
[1]   SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].
BINNING, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61
[2]   SCANNING-TUNNELING MICROSCOPY AT SMALL TIP-TO-SURFACE DISTANCES [J].
CIRACI, S ;
BATRA, IP .
PHYSICAL REVIEW B, 1987, 36 (11) :6194-6197
[3]  
CIRACI S, IN PRESS BASIC CONCE
[4]  
CIRACI S, IN PRESS PHYS REV B
[5]  
CIRACI S, UNPUB
[6]   THEORY OF ADHESION AT A BIMETALLIC INTERFACE - OVERLAP EFFECTS [J].
FERRANTE, J ;
SMITH, JR .
SURFACE SCIENCE, 1973, 38 (01) :77-92
[7]   CONTACT RESISTANCE IN THE SCANNING TUNNELING MICROSCOPE AT VERY SMALL DISTANCES [J].
FERRER, J ;
MARTINRODERO, A ;
FLORES, F .
PHYSICAL REVIEW B, 1988, 38 (14) :10113-10115
[8]  
GARCIA NA, UNPUB
[9]   TRANSITION FROM THE TUNNELING REGIME TO POINT CONTACT STUDIED USING SCANNING TUNNELING MICROSCOPY [J].
GIMZEWSKI, JK ;
MOLLER, R .
PHYSICAL REVIEW B, 1987, 36 (02) :1284-1287
[10]  
LANDAUER R, 1988, Z PHYS B, V68, P27