METHODS OF MEASURING NOISE IN SEMICONDUCTOR NUCLEAR RADIATION DETECTORS

被引：0
|
作者：
ZAKHARCHUK, OV
机构：
来源：
MEASUREMENT TECHNIQUES | 1973年 / 16卷 / 01期
关键词：
D O I：
10.1007/BF00816696
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
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页码：92 / 95
页数：4
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