METHODS OF MEASURING NOISE IN SEMICONDUCTOR NUCLEAR RADIATION DETECTORS

被引：0

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作者：

ZAKHARCHUK, OV

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来源：

MEASUREMENT TECHNIQUES | 1973年 / 16卷 / 01期

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D O I：

10.1007/BF00816696

中图分类号：

T [工业技术];

学科分类号：

08 ;

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页码：92 / 95

页数：4

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