HIGH-RESOLUTION INCOHERENT IMAGING OF CRYSTALS

被引:523
作者
PENNYCOOK, SJ
JESSON, DE
机构
[1] Solid State Division, Oak Ridge National Laboratory, Oak Ridge
关键词
D O I
10.1103/PhysRevLett.64.938
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
A Bloch-wave analysis shows how a signal dependent on the electron intensity at the atom sites can be used to form an incoherent image of a crystal structure. To a good approximation the image is given by a convolution of a compositionally sensitive object function with an appropriate resolution function, and as such can be predicted and interpreted intuitively. Information on a scale below the resolution limit can be interpreted by deconvolution. © 1990 The American Physical Society.
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页码:938 / 941
页数:4
相关论文
共 19 条
[1]  
Born M., 1986, PRINCIPLES OPTICS, P415
[2]  
CHERNS D, 1973, Z NATURFORSCH A, VA 28, P565
[3]   SCANNING-TRANSMISSION ELECTRON-MICROSCOPY OF THIN SPECIMENS [J].
COWLEY, JM .
ULTRAMICROSCOPY, 1976, 2 (01) :3-16
[4]  
Gibson J. M., 1978, CHEM SCRIPTA, V14, P109
[5]   EFFECTS OF THERMAL DIFFUSE SCATTERING ON PROPAGATION OF HIGH ENERGY ELECTRONS THROUGH CRYSTALS [J].
HALL, CR ;
HIRSCH, PB .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1965, 286 (1405) :158-&
[6]   IMAGE-CONTRAST AND LOCALIZED SIGNAL SELECTION TECHNIQUES [J].
HOWIE, A .
JOURNAL OF MICROSCOPY-OXFORD, 1979, 117 (SEP) :11-23
[7]  
JESSON DE, IN PRESS
[8]  
KAMBE K, 1974, Z NATURFORSCH A, VA 29, P1034
[10]   SIMULATION OF ANNULAR DARK FIELD STEM IMAGES USING A MODIFIED MULTISLICE METHOD [J].
KIRKLAND, EJ ;
LOANE, RF ;
SILCOX, J .
ULTRAMICROSCOPY, 1987, 23 (01) :77-96