SURFACE ANALYSIS BY ION SPUTTERING AND QUADRUPOLE MASS-SPECTROMETRY

被引:0
作者
KARASEK, FW [1 ]
机构
[1] UNIV WATERLOO,DEPT CHEM,WATERLOO,ONTARIO,CANADA
来源
RESEARCH-DEVELOPMENT | 1973年 / 24卷 / 11期
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暂无
中图分类号
C93 [管理学]; O22 [运筹学];
学科分类号
070105 ; 12 ; 1201 ; 1202 ; 120202 ;
摘要
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页码:40 / &
相关论文
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EVANS, CA .
ANALYTICAL CHEMISTRY, 1972, 44 (13) :A67-&
[2]  
EVANS CA, 1973, 166 NAT ACS M CHIC
[3]  
KARASEK FW, 1973, RES DEV, V24, P25
[4]  
KARASEK FW, 1970, RES DEV, V21, P32
[5]  
KARASEK FW, 1973, RES DEV, V24
[6]   ANALYSIS OF SURFACES UTILIZING SPUTTER ION SOURCE INSTRUMENTS [J].
SOCHA, AJ .
SURFACE SCIENCE, 1971, 25 (01) :147-&
[7]  
1973, ISMA7073 COMM SCIENT