ION MICROPROBE MASS SPECTROMETER IN ALUMINUM ALLOY RESEARCH

被引：0
|
作者：
WESTERMAN, EJ
机构：
来源：
JOURNAL OF METALS | 1970年 / 22卷 / 12期
关键词：
D O I：
暂无
中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
引用
收藏
页码：28 / +
页数：1
相关论文
共 50 条
  • [1] A secondary ion microprobe ion trap mass spectrometer
    Todd, Peter J.
    Schaaff, T.Gregory
    1600, Elsevier Inc. (13):
  • [2] A secondary ion microprobe ion trap mass spectrometer
    Todd, PJ
    Schaaff, TG
    JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY, 2002, 13 (09) : 1099 - 1107
  • [3] VACUUM SYSTEM OF ION-MICROPROBE MASS SPECTROMETER
    BARRINGT.AE
    HERZOG, RFK
    POSCHENR.WP
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1966, 3 (05): : 239 - &
  • [4] EVALUATION OF A CESIUM PRIMARY ION-SOURCE ON AN ION MICROPROBE MASS-SPECTROMETER
    WILLIAMS, P
    LEWIS, RK
    EVANS, CA
    HANLEY, PR
    ANALYTICAL CHEMISTRY, 1977, 49 (09) : 1399 - 1403
  • [5] ION MICROPROBE MASS ANALYSIS FOR IRON AND STEEL RESEARCH
    MATSUMOTO, R
    SATO, K
    SUZUKI, KI
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1974, : 387 - 390
  • [6] VACUUM SYSTEM OF ION-MICROPROBE MASS SPECTROMETER FOR TRACE ANALYSIS OF SOLIDS
    BARRINGT.AE
    HERZOG, RFK
    POSCHENR.WP
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1965, 2 (05): : 281 - &
  • [7] Laser microprobe with Fourier transform ion cyclotron resonance mass spectrometer for surface analysis
    Moisio, Harri
    Van Vaeck, Luc
    Vangaever, Frank
    ANALYTICAL CHEMISTRY, 2007, 79 (01) : 280 - 290
  • [8] ION MICROPROBE MASS ANALYZER
    LIEBL, H
    JOURNAL OF APPLIED PHYSICS, 1967, 38 (13) : 5277 - &
  • [9] ION MICROPROBE MASS ANALYZER
    ANDERSEN, CA
    HINTHORNE, JR
    SCIENCE, 1972, 175 (4024) : 853 - +
  • [10] DEVELOPMENT OF A FAST ION MASS-SPECTROMETER FOR SPACE RESEARCH
    HAHN, SF
    BURCH, JL
    FELDMAN, WC
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1981, 52 (02): : 247 - 255
12345