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HIGH-RESOLUTION OCDR IN DISPERSIVE WAVE-GUIDES
被引:37
作者
:
BRINKMEYER, E
论文数:
0
引用数:
0
h-index:
0
机构:
Technische Universität Hamburg-Harburg, Hamburg 90, Eißendorfer Str. 40
BRINKMEYER, E
ULRICH, R
论文数:
0
引用数:
0
h-index:
0
机构:
Technische Universität Hamburg-Harburg, Hamburg 90, Eißendorfer Str. 40
ULRICH, R
机构
:
[1]
Technische Universität Hamburg-Harburg, Hamburg 90, Eißendorfer Str. 40
来源
:
ELECTRONICS LETTERS
|
1990年
/ 26卷
/ 06期
关键词
:
Dispersion;
Integrated optics;
Reflectometry;
Waveguides;
D O I
:
10.1049/el:19900270
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
In the analysis of integrated optical waveguide structures by coherence-domain reflectometry, spatial resolution may be seriously impaired by second order dispersion of the waveguides under test and by the presence of structures in the source spectrum. An algorithm for evaluation of measured interferograms is presented to correct for these effects. It is based on Fourier and wavenumber scale transformations. © 1990, The Institution of Electrical Engineers. All rights reserved.
引用
收藏
页码:413 / 414
页数:2
相关论文
共 4 条
[1]
MODIFIED OPTICAL FREQUENCY-DOMAIN REFLECTOMETRY WITH HIGH SPATIAL-RESOLUTION FOR COMPONENTS OF INTEGRATED OPTIC SYSTEMS
[J].
BARFUSS, H
论文数:
0
引用数:
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h-index:
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机构:
TECH UNIV HAMBURG,D-2100 HAMBURG 90,FED REP GER
TECH UNIV HAMBURG,D-2100 HAMBURG 90,FED REP GER
BARFUSS, H
;
BRINKMEYER, E
论文数:
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引用数:
0
h-index:
0
机构:
TECH UNIV HAMBURG,D-2100 HAMBURG 90,FED REP GER
TECH UNIV HAMBURG,D-2100 HAMBURG 90,FED REP GER
BRINKMEYER, E
.
JOURNAL OF LIGHTWAVE TECHNOLOGY,
1989,
7
(01)
:3
-10
[2]
OPTICAL REFLECTOMETRY WITH MICROMETER RESOLUTION FOR THE INVESTIGATION OF INTEGRATED OPTICAL-DEVICES
[J].
BEAUD, P
论文数:
0
引用数:
0
h-index:
0
机构:
SWISS PTT,CTR TECH,TECHNOL SECT,CH-3000 BERNE,SWITZERLAND
SWISS PTT,CTR TECH,TECHNOL SECT,CH-3000 BERNE,SWITZERLAND
BEAUD, P
;
SCHUTZ, J
论文数:
0
引用数:
0
h-index:
0
机构:
SWISS PTT,CTR TECH,TECHNOL SECT,CH-3000 BERNE,SWITZERLAND
SWISS PTT,CTR TECH,TECHNOL SECT,CH-3000 BERNE,SWITZERLAND
SCHUTZ, J
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SWISS PTT,CTR TECH,TECHNOL SECT,CH-3000 BERNE,SWITZERLAND
SWISS PTT,CTR TECH,TECHNOL SECT,CH-3000 BERNE,SWITZERLAND
HODEL, W
;
WEBER, HP
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h-index:
0
机构:
SWISS PTT,CTR TECH,TECHNOL SECT,CH-3000 BERNE,SWITZERLAND
SWISS PTT,CTR TECH,TECHNOL SECT,CH-3000 BERNE,SWITZERLAND
WEBER, HP
;
GILGEN, HH
论文数:
0
引用数:
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h-index:
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SWISS PTT,CTR TECH,TECHNOL SECT,CH-3000 BERNE,SWITZERLAND
SWISS PTT,CTR TECH,TECHNOL SECT,CH-3000 BERNE,SWITZERLAND
GILGEN, HH
;
SALATHE, RP
论文数:
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引用数:
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h-index:
0
机构:
SWISS PTT,CTR TECH,TECHNOL SECT,CH-3000 BERNE,SWITZERLAND
SWISS PTT,CTR TECH,TECHNOL SECT,CH-3000 BERNE,SWITZERLAND
SALATHE, RP
.
IEEE JOURNAL OF QUANTUM ELECTRONICS,
1989,
25
(04)
:755
-759
[3]
DANIELSON BL, 1987, APPL OPTICS, V14, P2836
[4]
OPTICAL COHERENCE-DOMAIN REFLECTOMETRY - A NEW OPTICAL EVALUATION TECHNIQUE
[J].
YOUNGQUIST, RC
论文数:
0
引用数:
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h-index:
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YOUNGQUIST, RC
;
CARR, S
论文数:
0
引用数:
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CARR, S
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DAVIES, DEN
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h-index:
0
DAVIES, DEN
.
OPTICS LETTERS,
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(03)
:158
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←
1
→
共 4 条
[1]
MODIFIED OPTICAL FREQUENCY-DOMAIN REFLECTOMETRY WITH HIGH SPATIAL-RESOLUTION FOR COMPONENTS OF INTEGRATED OPTIC SYSTEMS
[J].
BARFUSS, H
论文数:
0
引用数:
0
h-index:
0
机构:
TECH UNIV HAMBURG,D-2100 HAMBURG 90,FED REP GER
TECH UNIV HAMBURG,D-2100 HAMBURG 90,FED REP GER
BARFUSS, H
;
BRINKMEYER, E
论文数:
0
引用数:
0
h-index:
0
机构:
TECH UNIV HAMBURG,D-2100 HAMBURG 90,FED REP GER
TECH UNIV HAMBURG,D-2100 HAMBURG 90,FED REP GER
BRINKMEYER, E
.
JOURNAL OF LIGHTWAVE TECHNOLOGY,
1989,
7
(01)
:3
-10
[2]
OPTICAL REFLECTOMETRY WITH MICROMETER RESOLUTION FOR THE INVESTIGATION OF INTEGRATED OPTICAL-DEVICES
[J].
BEAUD, P
论文数:
0
引用数:
0
h-index:
0
机构:
SWISS PTT,CTR TECH,TECHNOL SECT,CH-3000 BERNE,SWITZERLAND
SWISS PTT,CTR TECH,TECHNOL SECT,CH-3000 BERNE,SWITZERLAND
BEAUD, P
;
SCHUTZ, J
论文数:
0
引用数:
0
h-index:
0
机构:
SWISS PTT,CTR TECH,TECHNOL SECT,CH-3000 BERNE,SWITZERLAND
SWISS PTT,CTR TECH,TECHNOL SECT,CH-3000 BERNE,SWITZERLAND
SCHUTZ, J
;
HODEL, W
论文数:
0
引用数:
0
h-index:
0
机构:
SWISS PTT,CTR TECH,TECHNOL SECT,CH-3000 BERNE,SWITZERLAND
SWISS PTT,CTR TECH,TECHNOL SECT,CH-3000 BERNE,SWITZERLAND
HODEL, W
;
WEBER, HP
论文数:
0
引用数:
0
h-index:
0
机构:
SWISS PTT,CTR TECH,TECHNOL SECT,CH-3000 BERNE,SWITZERLAND
SWISS PTT,CTR TECH,TECHNOL SECT,CH-3000 BERNE,SWITZERLAND
WEBER, HP
;
GILGEN, HH
论文数:
0
引用数:
0
h-index:
0
机构:
SWISS PTT,CTR TECH,TECHNOL SECT,CH-3000 BERNE,SWITZERLAND
SWISS PTT,CTR TECH,TECHNOL SECT,CH-3000 BERNE,SWITZERLAND
GILGEN, HH
;
SALATHE, RP
论文数:
0
引用数:
0
h-index:
0
机构:
SWISS PTT,CTR TECH,TECHNOL SECT,CH-3000 BERNE,SWITZERLAND
SWISS PTT,CTR TECH,TECHNOL SECT,CH-3000 BERNE,SWITZERLAND
SALATHE, RP
.
IEEE JOURNAL OF QUANTUM ELECTRONICS,
1989,
25
(04)
:755
-759
[3]
DANIELSON BL, 1987, APPL OPTICS, V14, P2836
[4]
OPTICAL COHERENCE-DOMAIN REFLECTOMETRY - A NEW OPTICAL EVALUATION TECHNIQUE
[J].
YOUNGQUIST, RC
论文数:
0
引用数:
0
h-index:
0
YOUNGQUIST, RC
;
CARR, S
论文数:
0
引用数:
0
h-index:
0
CARR, S
;
DAVIES, DEN
论文数:
0
引用数:
0
h-index:
0
DAVIES, DEN
.
OPTICS LETTERS,
1987,
12
(03)
:158
-160
←
1
→