A NEW MICROSCOPE FOR SEMICONDUCTOR LUMINESCENCE STUDIES

被引：4

作者：

APLIN, PS

DAY, JCC

机构：

[1] Physics Department, University of Bristol, Bristol, BS8 1TL, Tyndall Avenue

来源：

MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1990年 / 5卷 / 02期

关键词：

D O I：

10.1016/0921-5107(90)90078-P

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A confocal scanning optical microscope is integrated with a helium cryostat to provide submicron spatial resolution of a specimen immersed in helium. Using gaseous or superfluid liquid helium, specimen temperature can be controlled from 300 to 2 K. Monochromatic illumination is provided and luminescence is analysed by conventional means. The specimen is scanned mechanically and its position relative to the focal point of the optical system is continously monitored by a capacitance displacement transducer and an optical system that senses light reflected from the specimen surface. © 1990.

引用

页码：329 / 331

页数：3