X-RAY FOCUSING FOR SYNCHROTRON RADIATION MICROPROBE ANALYSIS AT THE SRS, DARESBURY (UK)

被引：11
作者：
VANLANGEVELDE, F
LENGLET, WJM
OVERWATER, RMW
VIS, RD
HUIZING, A
VIEGERS, MPA
ZEGERS, CPGM
VANDERHEIDE, JA
机构：
[1] PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
[2] EINDHOVEN UNIV TECHNOL,DEPT PHYS,5600 MB EINDHOVEN,NETHERLANDS
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1987年 / 257卷 / 02期
关键词：
D O I：
10.1016/0168-9002(87)90770-4
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：436 / 442
页数：7
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