THE PHENOMENON OF ELECTRON ROLLOUT FOR ENERGY DEPOSITION AND DEFECT GENERATION IN IRRADIATED MOS DEVICES

被引：19
作者：
BROWN, DB
机构：
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1986年 / 33卷 / 06期
关键词：
D O I：
10.1109/TNS.1986.4334585
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1240 / 1244
页数：5
相关论文
共 15 条
[1]   INTERACTION OF LOW-ENERGY ELECTRONS WITH SILICON DIOXIDE [J].
ASHLEY, JC ;
ANDERSON, VE .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1981, 24 (02) :127-148
[2]   ELECTRON-HOLE PAIR CREATION ENERGY IN SIO2 [J].
AUSMAN, GA ;
MCLEAN, FB .
APPLIED PHYSICS LETTERS, 1975, 26 (04) :173-175
[3]  
BENEDETTO JM, 1986, JUL IEEE NUCL SPAC R
[4]   REDUCING ERRORS IN DOSIMETRY CAUSED BY LOW-ENERGY COMPONENTS OF CO-60 AND FLASH X-RAY SOURCES [J].
BROWN, DB ;
DOZIER, CM .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1982, 29 (06) :1996-1999
[5]   PHOTOELECTRON EFFECTS ON THE DOSE DEPOSITED IN MOS DEVICES BY LOW-ENERGY X-RAY SOURCES [J].
BROWN, DB .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (06) :1465-1468
[6]  
Burke E., COMMUNICATION
[7]  
BURKE EA, 1976, IEEE T NUC SCI, V23, P1839
[8]  
Burlin T E, 1968, RAD DOSIMETRY, V1, P331
[9]   PRODUCTION OF A STANDARD RADIATION ENVIRONMENT TO MINIMIZE DOSIMETRY ERRORS IN FLASH X-RAY PARTS TESTING [J].
DOZIER, CM ;
BROWN, DB .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1984, 31 (06) :1084-1088
[10]   DEFECT PRODUCTION IN SIO2 BY X-RAY AND CO-60 RADIATIONS [J].
DOZIER, CM ;
BROWN, DB ;
THROCKMORTON, JL ;
MA, DI .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1985, 32 (06) :4363-4368
12