FROM ATOMS TO INTEGRATED-CIRCUIT CHIPS, BLOOD-CELLS, AND BACTERIA WITH THE ATOMIC FORCE MICROSCOPE

被引：155
作者：
GOULD, SAC
DRAKE, B
PRATER, CB
WEISENHORN, AL
MANNE, S
HANSMA, HG
HANSMA, PK
MASSIE, J
LONGMIRE, M
ELINGS, V
NORTHERN, BD
MUKERGEE, B
PETERSON, CM
STOECKENIUS, W
ALBRECHT, TR
QUATE, CF
机构：
[1] DIGITAL INSTRUMENTS,GOLETA,CA 93117
[2] SANSUM MED RES FDN,SANTA BARBARA,CA 93105
[3] UNIV CALIF SAN FRANCISCO,CARDIOVASC RES INST,DEPT BIOCHEM & BIOPHYS,SAN FRANCISCO,CA 94143
[4] STANFORD UNIV,DEPT APPL PHYS,STANFORD,CA 94305
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1990年 / 8卷 / 01期
关键词：
D O I：
10.1116/1.576398
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
The atomic force microscope (AFM) can now bridge the gap from imaging objects that can be seen with an optical microscope to imaging atoms: a range in magnification of 104. High magnification images of germanium show single atoms separated by 0.4 nm while low magnification images of entire cells and portions of an integrated circuit chip provide lateral and vertical information over a range of 25 um. © 1990, American Vacuum Society. All rights reserved.
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页码：369 / 373
页数：5
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