A MODEL FOR CONDUCTOR FAILURE CONSIDERING DIFFUSION CONCURRENTLY WITH ELECTROMIGRATION RESULTING IN A CURRENT EXPONENT OF 2

被引：214
作者：
SHATZKES, M
LLOYD, JR
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1986年 / 59卷 / 11期
关键词：
D O I：
10.1063/1.336731
中图分类号：
O59 [应用物理学];
学科分类号：
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页码：3890 / 3893
页数：4
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