DESIGN AND PERFORMANCE OF A GAMMA-RAY DIFFRACTOMETER AT 0.12-A

被引：17

作者：

ALKIRE, RW ^{[1
]}

YELON, WB ^{[1
]}

机构：

[1] UNIV MISSOURI,RES REACTOR,COLUMBIA,MO 65211

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1981年 / 14卷 / DEC期

关键词：

D O I：

10.1107/S002188988100962X

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：362 / 369

页数：8

共 20 条

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[10] ACCURATE AND STRAIGHTFORWARD ALIGNMENT PROCEDURES FOR X-RAY DIFFRACTOMETERS EQUIPPED WITH A EULERIAN CRADLE [J].

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