SIMPLE INTERNAL PHOTOEMISSION METHOD FOR DETERMINING SHAPE OF YIELD CURVES OF NEGATIVE ELECTRON AFFINITY SEMICONDUCTORS

被引：14

作者：

ESCHER, JS ^{[1
]}

WILLIAMS, BF ^{[1
]}

机构：

[1] RCA ELECT COMPONENTS,DAVID SARNOFF RES CTR,ELECTROOPTICS LAB,PRINCETON,NJ 08540

来源：

关键词：

D O I：

10.1063/1.1661930

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：525 / 526

页数：2

共 5 条

BELL, RL ;

SPICER, WE .

PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1970, 58 (11) :1788-+

[2] DEMOUNTABLE ELECTROLYTE CONTACT CELL [J].

GOODMAN, AM ;

MORGAN, JD .

TIETJEN, JJ ;

AMICK, JA .

[4] CURRENT STATUS OF NEGATIVE ELECTRON AFFINITY DEVICES [J].

WILLIAMS, BF ;

TIETJEN, JJ .

PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1971, 59 (10) :1489-+

WILLIAMS, R .