INFRARED SENSING AND ANALYSIS IN INDUSTRIAL MEASUREMENTS

被引:4
作者
LAMMASNIEMI, J
HYVARINEN, T
机构
[1] VTT Optoelectronics Laboratory, SF-90571 Oulu
关键词
D O I
10.1016/0924-4247(93)80030-K
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Spectroscopic measurements at infrared and visible wavelengths are widely used as a tool for laboratory analysis. Due to technological improvements, more and more possibilities are opened for making similar methodology feasible for direct on-line process measurements in harsh industrial conditions or small portable equipment. New optoelectronic components together with compact design can even be used to realize integrated sensor-like analyser devices. Array and multiple-wavelength detectors reduce the need for mechanisms for wavelength multiplexing and offer the possibility of simultaneous measurement of several wavelength channels. The use of narrow-band semiconductor sources gives advantages for modulation arrangements. Using array sources, electronic wavelength scanning becomes possible in some applications. The increased real-time signal-processing capability can be used to implement more complex measuring principles and efficiently compensate for disturbing effects. Instead of using only a few wavelengths, a whole spectral band analysis can be employed. As an example, real-time multielement analysis, with complex calibration functions, becomes a feasible industrial methodology. The fields of application for infrared analysers can be found in chemical process industries, food industries, energy production, and environmental protection. Portable and integrated sensor-like analyser components substantially increase application markets.
引用
收藏
页码:173 / 179
页数:7
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