DESIGN OF TESTABILITY FOR ANALOG FAULT-DIAGNOSIS

被引：10
|
作者：
WEY, CL
机构：
来源：
INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS | 1987年 / 15卷 / 02期
关键词：
D O I：
10.1002/cta.4490150204
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：123 / 142
页数：20
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