DESIGN OF TESTABILITY FOR ANALOG FAULT-DIAGNOSIS

被引：10

|

作者：

WEY, CL

机构：

来源：

INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS | 1987年 / 15卷 / 02期

关键词：

D O I：

10.1002/cta.4490150204

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

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页码：123 / 142

页数：20

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