DIRECT RESOLUTION AND IDENTIFICATION OF THE SUBLATTICES IN COMPOUND SEMICONDUCTORS BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY

被引：23

作者：

OURMAZD, A

RENTSCHLER, JR

TAYLOR, DW

机构：

来源：

PHYSICAL REVIEW LETTERS | 1986年 / 57卷 / 24期

关键词：

D O I：

10.1103/PhysRevLett.57.3073

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：3073 / 3076

页数：4

相关论文

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AHLBORN, K ;

IBEH, K ;

HONDA, T .

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[2] INTERPRETING HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROGRAPHS [J].

SELF, PG ;

GLAISHER, RW ;

SPARGO, AEC .

ULTRAMICROSCOPY, 1985, 18 (1-4) :49-62

[3]

Spence J.C.H., 1980, EXPT HIGH RESOLUTION